Taking Hitachi Atomic Absorption Spectrophotometers into a Next Stage
Hitachi offers high-precision background correction and high-sensitivity measurement by employing the polarized Zeeman correction method alongside the dual detector method.
The addition of a new rapid sequential mode* (supports the flame method) makes it possible to perform even higher throughput analysis, allowing for fast, precise, and highly reproducible measurements in a variety of fi elds, including research and quality management.
The polarized Zeeman correction method, which uses a permanent magnet, provides a stabilized baseline, suppresses the effects of coexisting materials that have absorption of adjacent wavelengths, and facilitates highly reliable analysis.
The dual detector method, by which the sample light and reference light are sampled by independent detectors, reduces the baseline noise. The two lights are also detected simultaneously, which increases the accuracy of corrections.
Background correction can be performed for elements that have absorption in the ultraviolet range or visible range. The polarized Zeeman correction method is one choice of correction method and has the advantage that it does not need to be selected for each element. It can also correct elements that cannot be corrected by the D2 lamp correction method, such as sodium and potassium.
Hitachi has achieved even higher speed in measurements by combining the existing polarized Zeeman correction method with a newly developed diff raction grating drive mechanism. This provides much faster measurements for users who are measuring multiple elements in the same sample using the fl ame method.
