EEM View is a completely new concept system in the world which delivers fluorescence, reflection spectra and these images simultaneously. To make it possible, AI technology is applied to analyze data with a special algorithm*1. This measurement is possible by installing the EEM View Accessory on the F-7000 / 7100 Fluorescent Spectrophotometer.
EEM View Mode (Measurement Modes):
Data Processing Features:
*1 The spectral analysis algorithm was developed through joint research by Professor Imari Sato and Associate Professor Yinqiang Zheng of the National Institute of Informatics.
Specifications
Irradiation Wavelength: 360 to 700 nm
Camera: Color (RGB) CMOS sensor
Interface: USB 3.0
Effective Number of Pixels: 1920 × 1200 (H × V)
Photographable Wavelengths: 380 to 700 nm
Note: Main specifications of the photometer conform to those of the fluorescence spectrophotometer main unit.
Example Configuration
F-7100 Fluorescence Spectrophotometer: 5J1-0041 / 5J1-0042
EEM View Accessory: 5J0-0570
R928F Photomultiplier: 650-1246
Substandard Light Source: 5J0-0135 / 5J0-0136